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Current density distribution in resistive fault current limiters and its effect on device stability
Physica C: Superconductivity and its Applications ( IF 1.3 ) Pub Date : 2020-11-07 , DOI: 10.1016/j.physc.2020.1353786
M. Farokhiyan , M. Hosseini , A. Kavousi-Fard

The increase of current uniformity along of a Resistive type Superconductor Fault Current Limiter (R-SFCL) in the design of this type of limiters is well perceived as an important issue. The non-uniform distribution of current in R-SFCL only increases the current in some superconducting regions, as a result, in the fault conditions, only certain parts of the superconductor undergo a phase change that increases the heat pressure in those areas and causes the breakdown and destruction of the device. In this paper, the current density distributions in common patterns used in R-SFCs constructions have been simulated and investigated. To this end, an effective model is proposed for R-SFCL to achieve the highest uniformity of current and harmonic phase change over superconductors compared to other patterns. The simulation results in the Ansys Maxwell Software advocate the appropriate and satisfying performance of the proposed model.



中文翻译:

电阻故障限流器中的电流密度分布及其对器件稳定性的影响

在这种类型的限制器的设计中,随着电阻型超导体故障电流限制器(R-SFCL)的电流均匀性的增加,被认为是一个重要问题。R-SFCL中电流的不均匀分布只会增加某些超导区域中的电流,因此,在故障情况下,只有超导体的某些部分会发生相变,从而增加那些区域中的热压并导致设备的故障和破坏。在本文中,已经对R-SFC构造中常用模式中的电流密度分布进行了仿真和研究。为此,为R-SFCL提出了一种有效的模型,与其他模式相比,该模型在超导体上实现了电流和谐波相变的最高均匀性。

更新日期:2020-11-12
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