Two-dimensional (2D) nanolayers have found increasingly widespread applications in the modern flexible electronic devices. Their adhesion with its neighbouring layers can significantly affect the mechanical stability and the reliability of those devices. However, the measurement of such adhesion has been a great challenge. In this work, we develop a new and simple methodology to measure the interfacial adhesion between a mica nanolayer (MNL) and a single-layer graphene (SLG) supported by a SiO2 substrate. The method is based on the well-known Obreimoff method but integrated with innovative nanomanipulation and profile measuring approaches. Our study shows that the adhesion energy of MNLs on the SLG/SiO2 substrate system is considerably lower than that on the SiO2 substrate alone. Quantitative analyses reveal that the wrinkles formed on the SLG can considerably lower the adhesion. This outcome is of technological value as the adhesion maybe tailored by controlling the wrinkle formation in the graphene layer in a flexible electronic device.

中文翻译：

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云母纳米层在由 SiO2 衬底支撑的单层石墨烯上的粘附性在空气中表征

二维 (2D) 纳米层在现代柔性电子设备中的应用越来越广泛。它们与其相邻层的粘附会显着影响这些设备的机械稳定性和可靠性。然而，这种粘附力的测量一直是一个巨大的挑战。在这项工作中，我们开发了一种新的简单方法来测量云母纳米层 (MNL) 和由 SiO2 衬底支撑的单层石墨烯 (SLG) 之间的界面附着力。该方法基于著名的 Obreimoff 方法，但结合了创新的纳米操作和轮廓测量方法。我们的研究表明，MNL 在 SLG/SiO2 衬底系统上的粘附能明显低于单独在 SiO2 衬底上的粘附能。定量分析表明，在 SLG 上形成的皱纹会大大降低附着力。这一结果具有技术价值，因为可以通过控制柔性电子设备中石墨烯层中的皱纹形成来调整粘附力。