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A low-pass filtering Fresnel zone plate for soft x-ray microscopic analysis down to the lithium K-edge region
Review of Scientific Instruments ( IF 1.6 ) Pub Date : 2020-10-01 , DOI: 10.1063/5.0020956
Takuji Ohigashi 1, 2 , Hayato Yuzawa 1 , Nobuhiro Kosugi 1, 2
Affiliation  

We have designed a new low-pass Fresnel zone plate (LPFZP) to extend soft x-ray absorption spectroscopy (XAS) to the lithium K absorption edge in a scanning transmission x-ray microscope (STXM). The performance of the LPFZP was evaluated in the STXM beamline at the UVSOR-III Synchrotron (Okazaki, Japan); the contribution of the higher-order harmonics is successfully suppressed to 0.1% of the fundamental energy, and a spatial resolution of 72 nm and an energy resolution (E/∆E) above 1000 are achieved as expected. XAS spectra of lithium are measured successfully in an electrode of a lithium-ion battery.

中文翻译:

低通滤波菲涅耳波带片,用于软 X 射线显微分析,直至锂 K 边缘区域

我们设计了一种新的低通菲涅耳波带片 (LPFZP),以将软 X 射线吸收光谱 (XAS) 扩展到扫描透射 X 射线显微镜 (STXM) 中的锂 K 吸收边缘。LPFZP 的性能在 UVSOR-III 同步加速器(日本冈崎)的 STXM 光束线中进行评估;高次谐波的贡献被成功抑制到基波能量的 0.1%,并且按预期实现了 72 nm 的空间分辨率和 1000 以上的能量分辨率 (E/ΔE)。在锂离子电池的电极中成功测量了锂的 XAS 光谱。
更新日期:2020-10-01
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