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X-Ray Diffraction Analysis of the Amorphous–Crystalline Phase Transition in Ni
Technical Physics ( IF 1.1 ) Pub Date : 2020-10-19 , DOI: 10.1134/s1063784220100102
D. Yu. Kovalev , I. I. Chuev

Abstract

Systematic data on the amorphous–crystalline transition in Ni have been obtained by high-temperature X-ray diffraction analysis. It is established that the amorphous structure of Ni nanoparticles is stable up to 200°C. Ni nanocrystals, which have coherent-scattering regions (CSRs) 5–15 nm in size (depending on the isothermal annealing temperature) are formed in the temperature range of 300–600°C. The activation energy of nanocrystal growth has been estimated to be 67.3 kJ/mol. The dependence of the unit-cell parameter of nanocrystalline Ni on the CSR size is determined. An increase in the lattice constant is observed with an increase in CSR in nanocrystalline Ni particles.



中文翻译:

Ni中非晶态-晶体相变的X射线衍射分析

摘要

通过高温X射线衍射分析获得了Ni中非晶态-晶体转变的系统数据。已确定Ni纳米颗粒的非晶结构在高达200℃下是稳定的。Ni纳米晶体在300–600°C的温度范围内形成,其相干散射区(CSR)的尺寸为5–15 nm(取决于等温退火温度)。估计纳米晶体生长的活化能为67.3 kJ / mol。确定了纳米晶Ni的晶胞参数对CSR尺寸的依赖性。随着纳米晶Ni颗粒中CSR的增加,观察到晶格常数的增加。

更新日期:2020-10-30
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