Abstract With the introduction of the ISO26262 standard in the automotive field, numerous solutions for the in-field and on-line testing have been proposed. Among the several test solutions available, the Built-In Self-Test (BIST) approach is the most used for manufacturing test of chips, while the Software-Based Self-Test (SBST) approach is the most commonly used for on-line test the modern processors. This paper faces a very concrete problem concerning SBST development. In order to address more market demands, semiconductor industries are usually developing families of microcontroller, usually based on similar processors, instead of a single instance. This variety of architectures makes the development of SBST programs a repetitive, time and human consuming activity. The main aim of this work is to propose a methodology according with the SBST paradigm that permits to develop test programs able to achieve high coverage on different microcontrollers of the same family. The developed test programs are not showing any significant drop in coverage performance when they are used on different processors included in product of the same microcontroller family. The approach is based on the analysis of the processor hierarchy to identify the common units between the processors of the same family, first of all looking at those that show design differences. The module classification permits than to plan the most effective SBST development. A segment of industrial microcontrollers developed by STMicroelectronics for the automotive field, adapting many processors belonging to the same processor family, is used as a case of study. The experimental results demonstrate the effectiveness of the proposed approach, i.e., to reach the same fault coverage figures over many processors while dramatically reducing the development time.

中文翻译：

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为汽车微控制器系列开发软件测试库的有效策略

摘要 随着汽车领域ISO26262标准的引入，提出了大量的现场和在线测试解决方案。在可用的几种测试解决方案中，内置自检（BIST）方法最常用于芯片的制造测试，而基于软件的自测（SBST）方法最常用于在线测试现代处理器。本文面临着一个关于SBST发展的非常具体的问题。为了满足更多的市场需求，半导体行业通常会开发微控制器系列，通常基于类似的处理器，而不是单一实例。这种多样化的体系结构使 SBST 程序的开发成为一项重复、耗时且耗费人力的活动。这项工作的主要目的是提出一种符合 SBST 范式的方法，该方法允许开发能够在同一系列的不同微控制器上实现高覆盖率的测试程序。开发的测试程序在同一微控制器系列产品中包含的不同处理器上使用时，没有显示出任何覆盖性能的显着下降。该方法基于对处理器层次结构的分析，以确定同一系列处理器之间的公共单元，首先查看那些显示设计差异的单元。模块分类允许规划最有效的 SBST 开发。STMicroelectronics 为汽车领域开发的一段工业微控制器，适配许多属于同一处理器系列的处理器，被用作研究案例。实验结果证明了所提出方法的有效性，即在许多处理器上达到相同的故障覆盖率，同时显着减少开发时间。