The present work proposes the use of two‐dimensional correlation mapping (2D‐CM) methods to analyze both particle induced X‐ray emission (PIXE) and Rutherford back scattering (RBS) spectra. RBS spectra of ion irradiated (H⁺ and He²⁺) poly(ether ether ketone) (PEEK) films were analyzed by both generalized and hybrid 2D‐CM techniques to reveal the chemistry involved in different ion irradiation types. The analysis indicated different irradiation mechanisms using He²⁺ and H⁺ high energy ion beams and was assigned to X‐linking and Y‐linking, respectively. The effects of sulfonation on the structure of PEEK membranes were also analyzed from their RBS and PIXE spectra. The sequential order of elemental concentration change with increasing the degree of sulfonation (DS) was determined as: N→S→O→C, and the origin of Nitrogen was assigned to the casting solvent as revealed from nuclear magnetic resonance (NMR) spectra. In addition, Hetro‐2D‐CM‐PIXE‐RBS analysis indicated the presence of three RBS Sulfur signals, and were assigned to Sulfur at surface, in the middle and in depth. 2D‐CM techniques could be considered as a promising approach to enrich information obtained by ion beam analysis.

中文翻译：

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通过二维相关映射技术分析RBS和PIXE数据：离子辐照和磺化对聚醚醚酮膜的影响

本工作建议使用二维相关映射（2D-CM）方法来分析粒子诱导的X射线发射（PIXE）和卢瑟福反散射（RBS）光谱。离子辐照（H ⁺和He ²⁺）聚醚醚酮（PEEK）膜的RBS光谱通过广义和混合2D-CM技术进行了分析，以揭示涉及不同离子辐照类型的化学反应。分析表明使用He ²⁺和H ^+的不同照射机理高能离子束，并分别分配给X链接和Y链接。磺化对PEEK膜结构的影响也从其RBS和PIXE光谱进行了分析。元素浓度随磺化度（DS）的增加而变化的顺序确定为：N→S→O→C，并且从核磁共振（NMR）光谱中发现氮的来源被分配给了铸造溶剂。此外，Hetro-2D-CM-PIXE-RBS分析表明存在三个RBS硫信号，并在表面，中部和深度将其分配给了硫。2D-CM技术可以被认为是丰富通过离子束分析获得的信息的有前途的方法。