We propose a direct experimental method to calibrate the relationship between ray directions in object space and their positions in the aperture plane of a light field microscope. The calibration improves the interpretation of light field images, which contain information from both types of image planes, the field plane and the aperture plane of the ray path in the microscope. Our method is based on the diffraction of line gratings of known periodicities and provides accurate results with subpixel resolution. The method can be custom‐tailored to most any optical configuration, including standard light microscopy setups, whenever correct mapping between ray parameters in the object/image plane and the aperture plane is needed.

中文翻译：

---

表征光学显微镜中孔径图像与射线方向之间关系的实验方法

我们提出了一种直接的实验方法来校准物体空间中的射线方向与其在光场显微镜的孔径平面中的位置之间的关系。校准改善了对光场图像的解释，该光场图像包含来自两种类型的图像平面，显微镜中光线路径的场平面和孔径平面的信息。我们的方法基于已知周期的线光栅的衍射，并以亚像素分辨率提供准确的结果。每当需要在对象/图像平面和光圈平面中的射线参数之间正确映射时，就可以针对大多数光学配置（包括标准光学显微镜设置）量身定制该方法。