A vignetting profile form is incorporated with characteristic X‐ray emission data from a Johann‐mounted crystal diffractometer. We prove the validity of the specific form of the vignetting profile. A new characterisation of the Kα profile for vanadium is presented, which supports and is superior to the current benchmark. Using the profile form as a correction for systematic vignetting reduces energy uncertainties by up to a factor of two or more. The greater precision in measurement robustness allows current atomic theories and profiles to be tested with higher levels of accuracy.

中文翻译：

---

渐晕的光子场，VKα的重新定性以及将X射线不确定性降低两倍

渐晕轮廓表与来自Johann安装的晶体衍射仪的特征X射线发射数据结合在一起。我们证明渐晕轮廓的特定形式的有效性。K个的一个新刻画α轮廓钒被呈现，其支撑并优于目前的基准。使用轮廓图作为系统渐晕的校正方法，可以将能量不确定性降低两个或更多倍。测量鲁棒性更高的精度允许以更高的精度水平测试当前的原子理论和轮廓。