A bent crystal Laue analyser (BCLA) is an X‐ray energy analyser used for fluorescence X‐ray absorption fine‐structure (XAFS) spectroscopy to separate the fluorescence X‐ray emission line of a target atom from the elastic scattering X‐rays and other fluorescence emission lines. Here, the feasibility of the BCLA for total reflection fluorescence XAFS (TRF‐XAFS), which has a long X‐ray footprint on the substrate surface owing to grazing incidence, was tested. The focal line of the BCLA was adjusted on the X‐ray footprint and the XAFS signal for one monolayer of Pt deposited on a 60 nm Au film with high sensitivity was obtained. Although range‐extended XAFS was expected by the rejection of Au fluorescence arising from the Au substrate, a small glitch was found in the Au L₃ edge because of the sudden change of the complex refraction index of the Au substrate at the Au edge. This abnormal spectrum feature can be removed by reflectivity correction using Au foil absorption data. BCLA combined with TRF‐XAFS spectroscopy (BCLA + TRF‐XAFS) is a new technique for the in situ surface analysis of highly dispersed systems even in the presence of a liquid overlayer.

中文翻译：

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弯曲晶体Laue分析仪结合全反射荧光X射线吸收精细结构（BCLA + TRF-XAFS）及其在表面研究中的应用

弯曲晶体劳厄分析仪（BCLA）是用于荧光X射线吸收精细结构（XAFS）光谱的X射线能量分析仪，用于将目标原子的荧光X射线发射线与弹性散射X射线和其他荧光发射线。在这里，测试了BCLA用于全反射荧光XAFS（TRF-XAFS）的可行性，该XAFS由于掠入射而在基板表面上具有较长的X射线足迹，因此。在X射线足迹上调整BCLA的焦线，并获得高灵敏度地沉积在60 nm Au膜上的一层Pt的XAFS信号。尽管可以通过抑制由Au底物引起的Au荧光来预期XAFS的扩展范围，但在Au L _3中发现了一个小毛刺由于在Au边缘处的Au衬底的复合折射率的突然变化，导致边缘发生变化。该异常光谱特征可以通过使用金箔吸收数据的反射率校正来去除。BCLA与TRF‐XAFS光谱仪（BCLA + TRF‐XAFS）相结合是一种即使在存在液体覆盖层的情况下也可以对高度分散的系统进行原位表面分析的新技术。