This study represents the detailed calculation of damage by Auger electrons of radionuclides $99mTc,111In,125I$ and $123I$ to DNA molecules at cellular scales, using Geant4-DNA toolkit. The average number of breaks in DNA are shown as a function of distance from the center of the DNA axis to position of Auger electron decay and compared with results obtained for different models of DNA used by others. The highest damage occurs for electrons with energies below 1 keV, and in proximity of DNA molecule. The calculation of DSB yield per Gy per Dalton is carried out for above radionuclides. The most considerable damage occurs when the distance between an Auger electron-emitting atom and DNA is about 2.5 nm, and 50% decreases happen when the distance is about 3.5 to 4 nm. DSB yield are comparable with other experimental and simulation data, and show a good agreement between our results and other works.

这项研究代表了放射性核素俄歇电子对损伤的详细计算 $99米ŤC，111\mathrm{一世}ñ，125\mathrm{一世}$ 和 $123\mathrm{一世}$使用Geant4-DNA工具包在细胞尺度上合成DNA分子。DNA断裂的平均数显示为从DNA轴中心到俄歇电子衰变位置的距离的函数，并与他人使用的不同DNA模型获得的结果进行了比较。对于能量低于1 keV且在DNA分子附近的电子，损害最大。对于上述放射性核素，每Gy每道尔顿的DSB收率进行了计算。当俄歇电子发射原子与DNA之间的距离约为2.5 nm时，会发生最严重的损坏；而当距离约为3.5至4 nm时，则会发生50％的减小。DSB产量可与其他实验和模拟数据相媲美，并且在我们的结果与其他工作之间显示出很好的一致性。