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Modification of an SiO $${}_{2}$$ (Au)/Si Surface by Irradiation with Argon Ions
Moscow University Physics Bulletin ( IF 0.4 ) Pub Date : 2020-10-13 , DOI: 10.3103/s0027134920030078
V. D. Bundyukova , D. V. Yakimchuk , E. Yu. Kaniukov , D. I. Tishkevich , M. D. Kutuzau , V. V. Prigodich , A. A. Shemukhin , Yu. V. Balakshin , A. V. Nazarov , A. V. Kozhemiako , A. P. Evseev , A. E. Ieshkin

Abstract

This article presents the results of gold deposition into pores of SiO\({}_{2}\)/Si matrices and the modifications of the obtained SiO\({}_{2}\)(Au)/Si systems by irradiation with argon Ar\({}^{+}\) ions with an energy of 100 keV with a fluence of \(5\times 10^{14}\) ion/cm\({}^{2}\). The effect of irradiation on changes in the surface topography of SiO\({}_{2}\)(Au)/Si systems and the signal intensity of surface-enhanced Raman scattering during the detection of the model analyte (methylene blue) have been shown.



中文翻译:

氩离子辐照对SiO $$ {} _ {2} $$(Au)/ Si表面的改性

摘要

本文介绍了金沉积到SiO \({} _ {2} \) / Si基质的孔中的结果以及通过辐照对获得的SiO \ {{} _ {2} \)(Au)/ Si系统的改性能量为100 keV的氩Ar \ {{} ^ {+} \)离子,通量为\(5×10 ^ {14} \) ion / cm \({} ^ {2} \)的氩离子。辐射对SiO \ {{} _ {2} \)(Au)/ Si系统表面形貌变化的影响以及模型分析物(亚甲蓝)检测过程中表面增强拉曼散射的信号强度被显示。

更新日期:2020-10-13
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