To improve the speed of an atomic force microscope (AFM), one must improve the bandwidth of its components, and the lateral XY scanner is no exception. Sinusoidal raster scans provide a simple way of improving lateral scan rates without the need for additional hardware and/or complex control algorithms. However, a raster scan using a sinusoidal waveform leads to a non-uniform probesample velocity. Uniform spatial sampling of scan data can be achieved in this case by varying the sampling rate as the probe sample velocity varies. In this work, we present a field-programmable gate array (FPGA)-based implementation of a sinusoidal raster scan with uniform spatial sampling for a high-speed atomic force microscope (HS-AFM). Using a home-made HS-AFM scanner and a custom controller, we demonstrate the performance of our approach by imaging Blu-ray disk data tracks in the contact mode. While the results show images comparable to those acquired using the traditional triangular raster scans, mirroring effects are better suppressed in high-speed imaging with sinusoidal scan signals.

中文翻译：

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高速原子力显微镜正弦光栅扫描的实现

为了提高原子力显微镜 (AFM) 的速度，必须提高其组件的带宽，横向 XY 扫描仪也不例外。正弦光栅扫描提供了一种提高横向扫描速率的简单方法，无需额外的硬件和/或复杂的控制算法。然而，使用正弦波形的光栅扫描会导致探测样本速度不均匀。在这种情况下，通过随着探头采样速度的变化而改变采样率，可以实现扫描数据的均匀空间采样。在这项工作中，我们提出了一种基于现场可编程门阵列 (FPGA) 的实现，用于高速原子力显微镜 (HS-AFM) 的具有均匀空间采样的正弦光栅扫描。使用自制的 HS-AFM 扫描仪和自定义控制器，我们通过在接触模式下对蓝光磁盘数据轨道进行成像来展示我们方法的性能。虽然结果显示的图像与使用传统三角光栅扫描获得的图像相当，但在使用正弦扫描信号的高速成像中更好地抑制了镜像效应。