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On space charge effects in laboratory-based photoemission electron microscopy using compact gas discharge extreme ultraviolet sources
New Journal of Physics ( IF 2.8 ) Pub Date : 2020-10-08 , DOI: 10.1088/1367-2630/abbc29
Daniel Wilson 1, 2, 3 , Christoph Schmitz 1, 2 , Denis Rudolf 1, 2 , Carsten Wiemann 1, 2 , Claus M Schneider 1, 2 , Larissa Juschkin 1, 2, 3
Affiliation  

The analysis of electronic and structural properties of surfaces has been greatly advanced by photoemission electron microscopy and spectroscopy techniques. To further improve lateral and energy resolution of the instruments, it is necessary to optimize parameters of the radiation sources employed for photoemission studies (e.g. photon flux, pulse duration, spot size etc). We studied space charge effects observed in an energy-filtering photoemission electron microscope operated with a compact laboratory-scale gas-discharge extreme ultraviolet light source. In this system, we found limits of spatial- and energy-resolution controlled by the source radiation parameters. The pulse repetition rate can be varied in the kHz range and the duration of the EUV emission was measured to be several tens of nanoseconds long, and thereby very different from the standard synchrotron sources typically used for similar experiments. The spatial resolution could be improved by a factor of 5, but on...

中文翻译:

使用紧凑型气体放电极紫外光源的基于实验室的光发射电子显微镜中的空间电荷效应

通过光发射电子显微镜和光谱学技术已经大大促进了表面电子和结构性质的分析。为了进一步提高仪器的横向和能量分辨率,有必要优化用于光发射研究的辐射源的参数(例如光子通量,脉冲持续时间,光斑大小等)。我们研究了在具有紧凑实验室规模的气体放电极紫外光源的能量过滤光电子显微镜下观察到的空间电荷效应。在该系统中,我们发现了受源辐射参数控制的空间分辨率和能量分辨率的限制。脉冲重复频率可以在kHz范围内变化,EUV发射的持续时间被测量为数十纳秒长,因此与通常用于类似实验的标准同步加速器光源有很大不同。可以将空间分辨率提高5倍,但是...
更新日期:2020-10-12
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