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Predicting fringe visibility in dual-phase grating interferometry with polychromatic x-ray sources
Journal of X-Ray Science and Technology ( IF 1.7 ) Pub Date : 2020-10-07 , DOI: 10.3233/xst-200726
Aimin Yan 1 , Xizeng Wu 1 , Hong Liu 2
Affiliation  

Dual phase grating X-ray interferometry is radiation dose-efficient as compared to common Talbot-Lau grating interferometry. The authors developed a general quantitative theory to predict the fringe visibility in dual-phase grating x-ray interferometry with polychromatic x-ray sources. The derivedformulas are applicable to setups with phase gratings of any phase modulation and with either monochromatic or polychromatic x-rays. Numerical simulations are presented to validate the derived formulas. The theory provides useful tools for design optimization of dual-phase grating x-ray interferometers.

中文翻译:

用多色 X 射线源预测双相位光栅干涉测量中的条纹可见度

与常见的 Talbot-Lau 光栅干涉测量法相比,双相光栅 X 射线干涉测量法具有辐射剂量效率。作者开发了一种通用定量理论来预测多色 x 射线源双相位光栅 x 射线干涉测量中的条纹可见性。派生公式适用于具有任何相位调制的相位光栅和单色或多色 X 射线的设置。给出了数值模拟来验证导出的公式。该理论为双相光栅X射线干涉仪的设计优化提供了有用的工具。
更新日期:2020-10-11
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