Characterization of the ionic transport and corresponding electro-elastic deformations in cerium oxide at the nanoscale are important for the understanding of the mechanism of the local response under an external electric field, especially the mechanisms of the ‘non-Newnham’'-type giant electrostriction. Here, we introduce a methodological approach to the analysis of signals in the piezoresponse force microscopy/electrochemical strain microscopy allowing decoupling ionic motion, electrostriction, and electrostatic contributions to the electromechanical signals based on a precise analysis of the electromechanical amplitude and phase as a function of temperature, and AC and DC biases. The ionic motion was demonstrated to be hampered in a 30–300°C temperature range, the typical operational range of commercial SPM microscopes. The local electromechanical response was interpreted as a mixture of the electrostatic-force-meditated response and conventional electrostriction.

中文翻译：

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掺杂二氧化铈的局部机电响应：严格的相位和幅度分析

在纳米尺度上表征氧化铈中的离子传输和相应的电弹性变形对于理解外部电场下局部响应的机制很重要，尤其是“非纽纳姆”型巨电致伸缩的机制. 在这里，我们介绍了一种在压电响应力显微镜/电化学应变显微镜中分析信号的方法论方法，该方法允许基于对机电振幅和相位的精确分析，将离子运动、电致伸缩和对机电信号的贡献解耦为温度以及交流和直流偏置。离子运动被证明在 30-300°C 的温度范围内受到阻碍，这是商业 SPM 显微镜的典型操作范围。