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Space-charge effects in ionization beam profile monitors
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment ( IF 1.5 ) Pub Date : 2020-10-09 , DOI: 10.1016/j.nima.2020.164744
Vladimir Shiltsev

Ionization profile monitors (IPMs) are widely used in accelerators for non-destructive and fast diagnostics of high energy particle beams. At high beam intensities, the space-charge forces make the measured IPM profiles significantly different from those of the beams. We analyze dynamics of the secondaries in IPMs and develop an effective algorithm to reconstruct the beam sizes from the measured IPM profiles. Efficiency of the developed theory is illustrated in application to the Fermilab 8 GeV proton Booster IPMs.



中文翻译:

电离束轮廓监测仪中的空间电荷效应

电离轮廓监测器(IPM)广泛用于加速器中,用于高能粒子束的无损和快速诊断。在高光束强度下,空间电荷力使测得的IPM轮廓与光束的轮廓明显不同。我们分析了IPM中次级的动力学,并开发了一种有效的算法来从测得的IPM轮廓重建光束尺寸。在Fermilab 8 GeV质子助推器IPM中的应用说明了已开发理论的效率。

更新日期:2020-10-12
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