Cylindrical vector beams are used to improve back scattering detection in photonic force microscopy measurements near a dielectric surface. We compare back focal plane interferometry signals acquired on a quadrant photodiode when optical trapping a latex microparticle with gaussian, radial, and azimuthal beams. We find a consistent reduction of the interference pattern generated by the superposition of light backscattered by the trapped particle and backreflected by the dielectric surface. We contrast experimental findings with a model based on light scattering theory in the T - matrix formalism.

中文翻译：

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使用圆柱矢量束在介电表面附近的光子力显微镜中改进的反向散射检测

圆柱形矢量束用于改善电介质表面附近的光子力显微镜测量中的反向散射检测。当用高斯光束，径向光束和方位角光束捕获乳胶微粒时，我们比较在象限光电二极管上获取的后焦平面干涉测量信号。我们发现由被捕获的粒子向后散射并由电介质表面向后反射的光的叠加所产生的干涉图样不断减小。我们将实验结果与基于光散射理论的T矩阵形式主义模型进行对比。