Background: Since the mechanical behavior of pantographic metamaterials depends upon the properties of their microstructure, accurate descriptions of unit cells are needed. Objective: The present effort is motivated by this requirement to characterize the detailed deformation of unit cells formed of two orthogonal sets of 3 beams. Methods: Their deformations in a bias extension test were measured via digital image correlation performed at different scales. Results: Thanks to the gray level residuals, the microscale results were found in better agreement with the experiment than mesoscale and macroscale analyses. Fine analyses around the hinges showed that relative displacements occurred between the two beam layers. Conclusions: Such experimental analyses supply full-field data to validate models (e.g., as a starting point in homogenization procedures) for describing the mechanical behavior of pantographic metamaterials.

中文翻译：

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应用于缩放结构的多尺度 DIC

背景：由于缩放超材料的机械行为取决于其微观结构的特性，因此需要准确描述晶胞。目标：目前的努力是由这一要求推动的，以表征由两个正交的 3 个梁组形成的单位单元的详细变形。方法：通过在不同尺度上执行的数字图像相关性来测量它们在偏置延伸测试中的变形。结果：由于灰度级残差，与中尺度和宏观尺度分析相比，微观尺度的结果与实验的一致性更好。铰链周围的精细分析表明，两个梁层之间发生了相对位移。结论：此类实验分析提供了用于验证模型的全场数据（例如，