Abstract

A theoretical formalism for quantitative description of X-ray diffraction from Langmuir monolayers under conditions of total external reflection has been developed. The proposed approach, based on the distorted-wave approximation, allows to consider physical mechanisms for plotting diffraction curves and maps (in the reciprocal space) for real monolayers and describe self-consistently specific features of Bragg peaks. The resulting algorithm can easily be implemented on a personal computer, which provides the opportunities to carry out numerical simulation of experimental two-dimensional diffraction intensity maps and determine reliably both the mean values of structural parameters of layers and their rms deviations.

中文翻译：

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二维晶体的X射线掠入射衍射分析的理论方法

摘要

已经开发出用于定量描述全外反射条件下Langmuir单层X射线衍射的理论形式主义。所提出的方法基于失真波逼近，可以考虑为真实单层绘制衍射曲线和映射（在倒数空间中）的物理机制，并描述布拉格峰的自洽特定特征。由此产生的算法可以很容易地在个人计算机上实现，这为进行实验二维衍射强度图的数值模拟以及可靠地确定层的结构参数平均值和均方根偏差提供了机会。