In this study, aged low-voltage breakers, including earth leakage breakers (ELBs) and molded case circuit breakers (MCCBs) with high rates of electrical fire occurrences, were collected from a field site and tested according to failure identification test criteria. Based on the International Electro technical Commission (IEC)’s failure judgment test criteria, pass or fail tests include lever repeat operations, the manual trip button for finding mechanical deformations and leakage sensitivity current test, the ELB earth leakage trip time test, and the MCCB overcurrent trip test to verify changes in electrical performance. The fault data obtained from the tests, expressed in years (yr), were analyzed for statistical life span prediction (SLP) using the Weibull distribution probability. The SLP analysis verified the fault data set’s distribution suitability and derived the mean time to failure (MTTF) using the Minitab statistical analysis tool. Sample analysis of aged low-voltage breakers determined that approximately 73% of the samples were found in homes, and their MTTFs were 19–23 year, longer than those suggested in the literature. The predicted life span of an ELB was also approximately 4 yr shorter than an MCCB, possibly due to the mechanical and electrical shock of internal electronic devices caused by the manual trip button test and the deteriorating electrolytic capacitors of some printed circuit boards (PCBs).

中文翻译：

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老化低压断路器的统计寿命估算研究

在这项研究中，从现场现场收集老化的低压断路器，包括漏电断路器 (ELB) 和塑壳断路器 (MCCB)，并根据故障识别测试标准进行测试。根据国际电工委员会 (IEC) 的故障判断测试标准，通过或失败测试包括杠杆重复操作、寻找机械变形的手动跳闸按钮和漏电敏感电流测试、ELB 漏电跳闸时间测试以及MCCB 过电流跳闸测试以验证电气性能的变化。从测试中获得的故障数据，以年 (yr) 表示，使用威布尔分布概率进行统计寿命预测 (SLP) 分析。SLP 分析验证了故障数据集的分布适用性，并使用 Minitab 统计分析工具得出了平均故障时间 (MTTF)。对老化低压断路器的样本分析确定，大约 73% 的样本是在家庭中发现的，其 MTTF 为 19-23 年，比文献中建议的要长。ELB 的预计寿命也比 MCCB 短约 4 年，这可能是由于手动脱扣按钮测试导致内部电子设备的机械和电击以及某些印刷电路板 (PCB) 的电解电容器老化所致。他们的 MTTF 为 19-23 年，比文献中建议的要长。ELB 的预计寿命也比 MCCB 短约 4 年，这可能是由于手动脱扣按钮测试导致内部电子设备的机械和电击以及某些印刷电路板 (PCB) 的电解电容器老化所致。他们的 MTTF 为 19-23 年，比文献中建议的要长。ELB 的预计寿命也比 MCCB 短约 4 年，这可能是由于手动脱扣按钮测试导致内部电子设备的机械和电击以及某些印刷电路板 (PCB) 的电解电容器老化所致。