Many connections exist in complex electronic equipment, which leads to a long duration of intermittent fault test and difficulty in achieving comprehensive coverage of intermittent fault. The intermittent fault mechanism and the multichannel intermittent fault parameter parallel capture method are investigated. A smaller module covers multiple intermittent connection faults in electronics and prevents missed detections. Based on the test results, a reliability assessment of the connection link with intermittent faults is needed in the next step. The correlation between the intermittent fault parameters and the reliability of connection link is analyzed, and the intermittent fault parameters are used to evaluate the connection link reliability. An aviation electrical connector and solder joint are used for testing. The results show that increases in the intermittent fault parameters are consistent with the trend of reliability degradation, which indicates that the proposed method can be applied to intermittent fault testing and reliability assessment for the connection link of electronic equipment.

中文翻译：

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电子设备间歇性故障多通道并行测试及可靠性评估


复杂的电子设备中存在较多的连线，导致间歇性故障测试持续时间较长，难以实现间歇性故障的全面覆盖。研究了间歇性故障机理和多路间歇性故障参数并行捕获方法。较小的模块可覆盖电子设备中的多个间歇性连接故障，并防止漏检。根据测试结果，下一步需要对间歇性故障的连接链路进行可靠性评估。分析间歇性故障参数与连接链路可靠性的相关性，利用间歇性故障参数评价连接链路的可靠性。采用航空电连接器和焊点进行测试。结果表明，间歇性故障参数的增加与可靠性下降的趋势一致，表明该方法可应用于电子设备连接链路的间歇性故障测试和可靠性评估。