A rapid method based on activation energy values for the lifetime assessment of PP films used as dielectrics for capacitors is proposed. The activation energy is determined from a nonisothermal measurement made by differential scanning calorimetry and an aging test at a single elevated temperature. The use of the onset temperature of the exothermal peak is proposed to evaluate the activation energy of the degradation of the PP film. Four types of PP film capacitors were thermally aged at 100 °C for different aging times. For each aging time, the capacitance was measured at different frequencies. According to the standards, two end-of-life criteria (2% and 5%) were imposed for the reduction in the capacitance. The parameters of the lifetime line $a$ and $b$ were determined, and finally, the lifetime values were calculated. The novel proposed method is effective in terms of both energy and manpower costs compared with the current method, which uses three aging temperatures.

中文翻译：

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活化能法计算电容器绝缘的热寿命

提出了一种基于活化能值的快速方法，用于评估用作电容器电介质的PP薄膜的寿命。活化能由通过差示扫描量热法进行的非等温测量和在单个升高的温度下的老化测试确定。建议使用放热峰的起始温度来评估PP膜降解的活化能。四种类型的PP薄膜电容器在100°C的温度下进行了不同的老化时间。对于每个老化时间，以不同的频率测量电容。根据标准，为减少电容，强制使用了两个寿命终止标准（2％和5％）。生命周期线的参数 $ a $ 和 $ b $ 确定，最后计算寿命值。与使用三个老化温度的当前方法相比，该新方法在能源和人力成本方面均有效。