The x-z cross-sectional profiles of fluorescent objects can be distorted in confocal microscopy, in large part due to mismatch between the refractive index of the immersion medium of typical high numerical aperture objectives and the refractive index of the medium in which the sample is present. Here, we introduce a method to mount fluorescent samples parallel to the optical axis. This mounting allows direct imaging of what would normally be an x-z cross-section of the object, in the x-y plane of the microscope. With this approach, the x-y cross-sections of fluorescent beads were seen to have significantly lower shape-distortions as compared to x-z cross-sections reconstructed from confocal z-stacks. We further tested the method for imaging of nuclear and cellular heights in cultured cells, and found that they are significantly flatter than previously reported. This approach allows improved imaging of the x-z cross-section of fluorescent samples. This article is protected by copyright. All rights reserved.

中文翻译：

---

一种荧光样品 x-z 横截面直接成像的方法

荧光物体的 xz 横截面轮廓在共聚焦显微镜中可能会失真，这在很大程度上是由于典型高数值孔径物镜的浸没介质的折射率与样品所在介质的折射率之间的不匹配。在这里，我们介绍了一种安装平行于光轴的荧光样品的方法。这种安装允许在显微镜的 xy 平面中直接成像通常是物体的 xz 横截面。通过这种方法，与从共焦 z 堆栈重建的 xz 横截面相比，荧光珠的 xy 横截面被认为具有显着较低的形状失真。我们进一步测试了培养细胞中核和细胞高度成像的方法，并发现它们比以前报道的要平坦得多。这种方法可以改进荧光样品 xz 横截面的成像。本文受版权保护。版权所有。