CLeANFIT – Contact‐Less Axial Nearfield‐Based Fluorescence Imaging Topography: A Method for 3D Micro‐ and Nanotopography Characterization,Advanced Materials Interfaces

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CLeANFIT – Contact‐Less Axial Nearfield‐Based Fluorescence Imaging Topography: A Method for 3D Micro‐ and Nanotopography Characterization
Advanced Materials Interfaces ( IF 4.3 ) Pub Date : 2020-10-05 , DOI: 10.1002/admi.202000581
Ima Ghaeli ₁ , Ricardo M. R. Adão ₁ , Jana B. Nieder ₁

Affiliation

A nearfield‐based topographic imaging method is presented to obtain 3D micro‐/nanotopography in labelled structures over lateral ranges of hundreds of micrometers with an axial thickness from 1000 nm to thin layers of below 100 nm. The contactless axial nearfield‐based fluorescence imaging topography (CLeANFIT) nanometrology technique is based on a modified model used in nearfield‐based super‐resolution imaging and sensing. The modified approach allows converting fluorescence lifetimes into nanoscale thicknesses of a fluorescent material in the nearfield of a metal surface. CLeANFIT is used to characterize the drying process of a fluorophore‐doped poly(vinyl alcohol)/water droplet and it allows to quantify the nanomorphological patterns formed during and after drying. CLeANFIT allows axial resolution similar to tip scanning techniques, while remaining contact‐free. Therefore, no damage occurs to the target allowing in situ studies. The final drying stage of droplet is analyzed through quantifying contact line dynamics. The axial sensitivity of CLeANFIT, makes it an exceptional technique to study interactions and dynamic phenomena at the liquid/solid interfaces in nanoscale dimensions, relevant for the development of novel nanomaterials, nanocoatings, and hybrid nanotechnology‐enabled integrated chips, that may be fabricated via nanoinkjet printing, photolithography, nanoimprint lithography, or other micro‐/nanofabrication techniques.

中文翻译：

CLeANFIT –少接触轴向近场荧光成像拓扑：一种用于3D微观和纳米拓扑表征的方法

提出了一种基于近场的地形成像方法，以在标记结构上从轴向范围从1000 nm到低于100 nm的薄层的数百微米横向范围内获得3D显微/纳米形貌。非接触式轴向近场荧光成像地形学（CLeANFIT）纳米计量技术基于基于近场超分辨率成像和传感的改进模型。改进的方法允许将荧光寿命转换为金属表面近场中荧光材料的纳米级厚度。CLeANFIT用于表征掺有荧光团的聚乙烯醇/水滴的干燥过程，并可以量化干燥过程中和干燥后形成的纳米形态图案。CLeANFIT允许轴向分辨率类似于尖端扫描技术，同时保持无接触。因此，不会对靶标造成损害，从而可以进行原位研究。通过量化接触线动力学分析液滴的最终干燥阶段。CLeANFIT的轴向灵敏度使其成为研究纳米级液/固界面处相互作用和动态现象的出色技术，与新型纳米材料，纳米涂层和支持混合纳米技术的集成芯片的开发有关，可以通过以下方法制造纳米喷墨印刷，光刻，纳米压印光刻或其他微/纳米加工技术。

更新日期：2020-11-21

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