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Visible Emission on Nanostructured CeO2 Thin Films Obtained by Spray Pyrolysis
Physica Status Solidi (A) - Applications and Materials Science Pub Date : 2020-10-02 , DOI: 10.1002/pssa.202000235
Mario Fidel García Sánchez 1 , Ismael Ponce Rosas 1 , José Francisco Malagón García 2 , Pepe Andraca 3 , Luis Lartundo 3 , Guillermo Santana 2
Affiliation  

Herein, the influence of the flow rate, substrate temperature, and thermal annealing at 700 °C on the optical and structural parameters of nanostructured ceria thin films prepared by ultrasonic spray pyrolysis is evaluated. The morphology, structure, and optical properties are studied by scanning electron microscopy, X‐ray diffraction, X‐ray photoelectron spectroscopy (XPS), and photoluminescence (PL). The spray conditions are optimized for obtaining smooth, dense, and homogeneous nanocrystalline films with grain sizes smaller than 20 nm. XPS demonstrates a high percentage (≈40%) of Ce3+ in the films, even in heat‐treated films (≈25%). The Ce3+ concentration does not depend on the growth temperature. Intense peaks at 575 and 618 nm are observed in PL measurements. These peaks are not reported in pure ceria thin films, they are dependent on the growth parameters (director and carrier gas flow rates and substrate temperature), and they are associated with levels produced by oxygen defects in the films. Variations in the flow rate modify the optimal temperature and the kinetic reaction, which also modifies the preferential orientation and the defect distribution in the films.

中文翻译:

喷雾热解获得的纳米结构CeO2薄膜的可见发射

本文中,评估了流速,基板温度和700℃下的热退火对通过超声喷雾热解制备的纳米结构二氧化铈薄膜的光学和结构参数的影响。通过扫描电子显微镜,X射线衍射,X射线光电子能谱(XPS)和光致发光(PL)研究了形态,结构和光学性质。优化喷涂条件以获得粒径小于20 nm的光滑,致密和均匀的纳米晶体薄膜。XPS证明,即使在热处理的薄膜中(约25%),薄膜中的Ce 3+的百分比也很高(约40%)。铈3+浓度不取决于生长温度。在PL测量中观察到在575和618 nm处的强烈峰。在纯二氧化铈薄膜中未报告这些峰,它们取决于生长参数(方向和载气流速和基材温度),并且与薄膜中氧缺陷产生的水平相关。流速的变化改变了最佳温度和动力学反应,这也改变了薄膜的优先取向和缺陷分布。
更新日期:2020-11-21
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