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Applied AI in instrumentation and measurement: The deep learning revolution
IEEE Instrumentation & Measurement Magazine ( IF 1.6 ) Pub Date : 2020-10-01
Mounib Khanafer, Shervin Shirmohammadi

In the last few years, hardly a day goes by that we do not hear about the latest advancements and improvements that Artificial Intelligence (AI) has brought to a wide spectrum of domains: from technology and medicine to science and sociology, and many others. AI is one of the core enabling components of the fourth industrial revolution that we are currently witnessing, and the applications of AI are truly transforming our world and impacting all facets of society, economy, living, working, and technology. The field of Instrumentation and Measurement (I&M) is no exception, and has already been impacted by Applied AI. In this article, we give an overview of Applied AI and its usage in I&M. We then take a deeper look at the I&M applications of one specific AI method: Deep Learning (DL), which has recently revolutionized the field of AI. Our survey of DL papers published in the IEEE Transactions on Instrumentation and Measurement (IEEE TIM) and IEEE Instrumentation & Measurement Magazine showed that, since 2017, there is a very strong interest in applying DL methods to I&M, in terms of measurement, calibration, and other I&M challenges. In particular, of the 32 surveyed papers, 75% were published in 2017 or later, and a remarkable 50% were published in 2019 alone. Considering that 2019 was not yet finished when we were writing this article, the recent exponential interest in and impact of DL in I&M is a very evident trend. We also found that although DL is used in a variety of I&M topics, a considerable portion of DL in I&M focuses on Vision Based Measurement (VBM) systems (around 28%) and fault/defect diagnosis/detection/prediction (around 25%). Finally, we found that Convolutional Neural Networks are the most widely used DL technique in I&M, especially in VBM. But to explain all of the above findings, we first need to understand AI itself and what we mean by it in its applied context. So let us begin our discussion with Applied AI.

中文翻译:

在仪器仪表和测量中应用AI:深度学习革命

在过去的几年中,我们几乎没有一天听到关于人工智能(AI)带给广泛领域的最新进步和改进的消息:从技术和医学到科学和社会学,以及许多其他领域。人工智能是我们当前目睹的第四次工业革命的核心推动因素之一,人工智能的应用正在真正改变我们的世界,并影响着社会,经济,生活,工作和技术的各个方面。仪器仪表和测量领域(I&M)也不例外,并且已经受到Applied AI的影响。在本文中,我们概述了Applied AI及其在I&M中的用法。然后,我们将更深入地研究一种特定的AI方法:深度学习(DL)的I&M应用,该方法最近改变了AI领域。我们对在IEEE仪器和测量交易(IEEE TIM)和IEEE仪器和测量杂志上发表的DL论文的调查显示,自2017年以来,人们对将DL方法应用于I&M的兴趣非常浓厚,涉及测量,校准,和其他I&M挑战。特别是,在32篇被调查论文中,有75%在2017年或以后发表,仅在2019年就有50%发表。考虑到我们撰写本文时2019年尚未结束,最近对DL在I&M中的兴趣及其影响是一个非常明显的趋势。我们还发现,尽管DL在各种I&M主题中使用,但I&M中的DL中相当一部分专注于基于视觉的测量(VBM)系统(约28%)和故障/缺陷诊断/检测/预测(约25%) 。最后,我们发现卷积神经网络是I&M中使用最广泛的DL技术,尤其是在VBM中。但是,要解释上述所有发现,我们首先需要了解AI本身以及在应用环境中的含义。因此,让我们开始与Applied AI进行讨论。
更新日期:2020-10-02
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