The advancement of Micro Pattern Gaseous Detector technology offers us different kinds of detectors with good spatial resolution and high rate capability and the Gas Electron Multiplier (GEM) detector is one of them. Typically GEM is made up of a thin polyimide foil having a thickness of 50 micrometers with 5 micrometers copper cladding on top and bottom sides. The presence of polyimide changes the gain of the detector under the influence of external radiation and the phenomenon is referred to as the charging up effect. The charging up effect is investigated with a double mask triple GEM detector prototype with Ar/CO$_2$ gas mixture in 70/30 ratio under continuous irradiation from a strong Fe$^{55}$ X-ray source. The detailed method of measurements and the test results are presented in this article.

中文翻译：

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三重GEM探测器充电效应研究

微模式气体检测器技术的进步为我们提供了具有良好空间分辨率和高倍率能力的不同类型的检测器，气体电子倍增器 (GEM) 检测器就是其中之一。通常，GEM 由厚度为 50 微米的薄聚酰亚胺箔组成，顶部和底部有 5 微米的覆铜层。聚酰亚胺的存在会在外部辐射的影响下改变探测器的增益，这种现象称为充电效应。在强 Fe$^{55}$ X 射线源的连续照射下，使用具有 70/30 比例的 Ar/CO$_2$ 气体混合物的双掩模三重 GEM 探测器原型研究充电效应。本文介绍了详细的测量方法和测试结果。