A fluorescence-yield wavelength-dispersive x-ray absorption spectroscopy technique in the soft x-ray region, by which the x-ray absorption spectra are recorded without scanning the monochromator, has been developed. The wavelength-dispersed soft x rays, in which the wavelength (photon energy) continuously changes as a function of the position, illuminate the sample, and the emitted fluorescence soft x rays at each position are separately focused by an imaging optics onto each position at a soft x-ray detector. Ni L-edge x-ray absorption spectra for Ni and NiO thin films taken in the wavelength-dispersive mode are shown in order to demonstrate the validity of the technique. The development of the technique paves the way for a real-time observation of time-dependent processes, such as surface chemical reactions, with much higher gas pressure compared to the electron-yield mode, as well as under magnetic and electric fields.

中文翻译：

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用于时间分辨实验的软 X 射线区域荧光产率波长色散 X 射线吸收光谱的发展

已经开发了一种在软 x 射线区域中的荧光产率波长色散 x 射线吸收光谱技术，通过该技术无需扫描单色器即可记录 x 射线吸收光谱。波长色散软 x 射线，其中波长（光子能量）作为位置的函数不断变化，照亮样品，每个位置发射的荧光软 x 射线由成像光学系统分别聚焦到每个位置软X射线探测器。显示了在波长色散模式下拍摄的 Ni 和 NiO 薄膜的 Ni L 边缘 X 射线吸收光谱，以证明该技术的有效性。该技术的发展为实时观察依赖于时间的过程铺平了道路，例如表面化学反应，