In this study, the mass attenuation coefficients of copper–silver thin‐film alloys, produced by the thermal evaporation method at various concentrations, were measured at six different energies in the range of 14.93–48.82 keV (keV) by X‐ray Fluorescence technique (XRF). A ²⁴¹Americium radioisotope source, having 50 mCi intensity and 59.54 keV energy photons, was used to stimulate the samples, and an Ultra‐LEGe detector was used to count the characteristic X‐rays emitted from the samples and from the source. At 14.93, 17.44, and 23.10 keV energies, the mass attenuation coefficients of Cu–Ag thin‐film alloys increased with increasing Cu concentration, while decreasing with increasing Cu concentration at 27.37, 32.068, and 48.82 keV energies. However, at 14.93, 17.44, and 23.10 keV energies, the mass attenuation coefficients decreased with increasing Ag concentration, while increasing with increasing Ag concentration at 27.37, 32.068, and 48.82 keV energies. The obtained results were compared with the values theoretically predicted by XCOM, and the experimental results are in good agreement with theoretical values within the error limits.

中文翻译：

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能量范围为14.93-48.82 keV的铜-银薄膜的质量衰减系数的研究

在这项研究中，通过X射线荧光技术，在14.93-48.82 keV（keV）范围内的六个不同能量下，通过热蒸发法在各种浓度下生产的铜-银薄膜合金的质量衰减系数进行了测量。 （XRF）。A ²⁴¹具有50 mCi强度和59.54 keV能量光子的放射性同位素源被用来刺激样品，而Ultra-LEGe检测器被用来对样品和从源发出的特征X射线进行计数。在14.93、17.44和23.10 keV能量下，Cu-Ag薄膜合金的质量衰减系数随Cu浓度的增加而增加，而在27.37、32.068和48.82 keV能量下随着Cu浓度的增加而减小。但是，在14.93、17.44和23.10 keV能量下，质量衰减系数随Ag浓度的增加而降低，而在27.37、32.068和48.82 keV能量下随着Ag浓度的增加而增加。将获得的结果与XCOM的理论预测值进行比较，