When performing transmission polychromatic beam topography, the extensions to the line segments of the diffraction images of a straight dislocation are shown to intersect at a single point on the X‐ray film. The location of this point, together with the diffraction pattern recorded on the film by synchrotron radiation, gives the crystallographic direction [hkl] of the dislocation unambiguously. The results of two synchrotron topography experiments are presented. Very long dislocations found in the center of a large 450 mm‐diameter Czochralski silicon crystal align with the growth direction [001]. In the other silicon sample, the dislocations are of mixed type and along the [011] direction.

中文翻译：

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使用同步加速器X射线透射形貌确定位错方向的几何形状

当执行透射多色光束形貌时，直线位错的衍射图像的线段扩展显示为在X射线胶片上的单个点相交。该点的位置，连同通过同步加速器辐射记录在薄膜上的衍射图，清楚地给出了位错的晶体学方向[ hkl ]。给出了两个同步加速器形貌实验的结果。在直径450 mm的大型直拉硅晶体的中心发现的非常长的位错与生长方向一致[001]。在另一个硅样品中，位错是混合型并且沿着[01 1 ]方向。