Scanning Transmission Electron Microscopy Diffraction Contrast Imaging (STEM-DCI) has been gaining popularity for the identification and analysis of dislocations in crystalline materials due to its ability to supress undesirable image features that are often present in conventional TEM images. However, there does not yet exist a robust body of work demonstrating expected contrast in these imaging conditions. A novel approach for the simulation of STEM-DCI images was developed using a modified form of the scattering matrix formalism. This algorithm was used to simulate a variety of dislocation configurations generated using three-dimensional discrete dislocation dynamics.

中文翻译：

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由离散位错动力学产生的复杂位错结构的扫描透射电子显微镜图像模拟

扫描透射电子显微镜衍射对比成像 (STEM-DCI) 由于能够抑制常规 TEM 图像中经常出现的不良图像特征，因此在晶体材料中位错的识别和分析方面越来越受欢迎。然而，目前还没有大量的工作来证明这些成像条件下的预期对比度。使用散射矩阵形式的修改形式开发了一种用于模拟 STEM-DCI 图像的新方法。该算法用于模拟使用三维离散位错动力学生成的各种位错配置。