We report here on a set of experiments that focus on measuring the timing performance of the Photonis miniPlanacon XPM85212/A1-S microchannel plate photomultiplier tubes along with the detector response at high event rates. The detector has a single photoelectron timing resolution of $30\mathrm{ps}$ at low rates ($10\mathrm{kHz}$). We show that both the gain and the timing start to deteriorate around $1\mathrm{MHz}$ with 20 photoelectrons per channel at $10^4$ target gain, giving the current per unit of area limits of 1.38 $\mathrm{\mu }\mathrm{A}∕\mathrm{cm}$² and 2.38 $\mathrm{\mu }\mathrm{A}∕\mathrm{cm}$² for the two tested devices. Photo-multiplier tubes with lower micro-channel plate resistivity exhibit a better rate capability due to the faster replenishment of the charge inside the microchannels. As we demonstrate, another method to improve the rate capability is to operate the photon detector tubes at a lower gain by reducing the supply voltage and compensating for the loss of amplitude by an additional amplification stage at the expense of the achieved timing resolution. The tube active area over which the beam is spread also plays a role since the same amount of light yields a better rate capability when spread over a larger area. The tubes exposed to high event rates showed an uncharacteristically slow recovery back to its initial gain with $80\mathrm{\%}$ of the initial gain recovered only after several tens of minutes.

我们在这里报告了一组实验，这些实验着重于测量Photonis miniPlanacon XPM85212 / A1-S微通道板光电倍增管的定时性能以及在高事件发生率时的检测器响应。该探测器的单光电子定时分辨率为$30\mathrm{ps}$ 低利率（$10\mathrm{千赫}$）。我们表明增益和时序都开始恶化$\mathrm{1个}\mathrm{兆赫}$ 每个通道有20个光电子 $\mathrm{1个}{0}^4$ 目标增益，给出的电流单位面积限制为1.38 $\mathrm{\mu }\mathrm{一种}∕\mathrm{厘米}$²和2.38$\mathrm{\mu }\mathrm{一种}∕\mathrm{厘米}$^2个测试设备。具有较低微通道板电阻率的光电倍增管由于具有更快的微通道内电荷补充能力，因此具有更好的倍率性能。正如我们论证的那样，另一种提高速率能力的方法是通过降低电源电压并通过额外的放大级来补偿幅度损失，从而以较低的增益操作光子检测器管，但要以达到的定时分辨率为代价。光束被散布在其上的管有效面积也起着作用，因为当在较大面积上散布时，相同数量的光会产生更好的速率能力。暴露于高事件发生率的电子管显示出恢复到其初始增益的异常缓慢的恢复$80\mathrm{％}$ 最初的收益只有几十分钟才能恢复。