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A complete grain-level assessment of the stress-strain evolution and associated deformation response in polycrystalline alloys
Acta Materialia ( IF 8.3 ) Pub Date : 2020-12-01 , DOI: 10.1016/j.actamat.2020.09.051
Michael D. Sangid , John Rotella , Diwakar Naragani , Jun-Sang Park , Peter Kenesei , Paul A. Shade

Abstract Polycrystalline alloys are used pervasively across structural applications contingent upon extensive experimental testing. A statistically representative number of tests are necessary to expose the variability in the material's performance, as a result of non-uniform microstructures and associated micromechanical fields. In a more direct means of capturing this pertinent information, multi-modal experimental techniques are presented to measure and track the complete micromechanical state, evolving during loading, of each and every grain within the regions of interest. Specifically, a combination of high-energy X-ray diffraction microscopy and digital image correlation coupled with electron backscatter diffraction are conducted on a specimen for each of the alloys, Haynes 282 and Ti7Al. The results of the multi-modal analysis definitively demonstrate that the degree of heterogeneity increases with deformation level and is used to assess the number of grains necessary for a representative volume element description of the stress state for each of these materials. Moreover, higher resolution imaging is used for identification of the slip system activity and subsequently used to study slip transmission events. An accurate knowledge of the resolved shear stress in adjacent grains (grain interactions) is demonstrated to be a key descriptor of the slip transmission events.

中文翻译:

多晶合金中应力-应变演变和相关变形响应的完整晶粒级评估

摘要 多晶合金广泛用于结构应用,这取决于广泛的实验测试。由于不均匀的微观结构和相关的微机械场,需要进行具有统计代表性的测试来揭示材料性能的可变性。在捕获此相关信息的更直接方式中,提出了多模态实验技术来测量和跟踪感兴趣区域内每个颗粒在加载过程中演变的完整微机械状态。具体来说,高能 X 射线衍射显微镜和数字图像相关性与电子背散射衍射相结合,对每种合金,Haynes 282 和 Ti7Al 的样品进行。多模态分析的结果明确地表明,不均匀程度随着变形水平的增加而增加,并用于评估每种材料的应力状态的代表性体积元素描述所需的晶粒数量。此外,更高分辨率的成像用于识别滑动系统活动,随后用于研究滑动传输事件。对相邻晶粒(晶粒相互作用)中解析剪切应力的准确了解被证明是滑动传递事件的关键描述符。高分辨率成像用于识别滑动系统活动,随后用于研究滑动传输事件。对相邻晶粒(晶粒相互作用)中解析剪切应力的准确了解被证明是滑动传递事件的关键描述符。高分辨率成像用于识别滑动系统活动,随后用于研究滑动传输事件。对相邻晶粒(晶粒相互作用)中解析剪切应力的准确了解被证明是滑动传递事件的关键描述符。
更新日期:2020-12-01
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