Abstract A series of single crystal Ni2MnGa1-xInx samples, varying in compositions between x = 0 to 0.15, were grown by Bridgman method. Critical temperatures were obtained from the magnetisation and electrical resistivity measurements. A Curie temperature and the temperatures of pre-martensitic and martensitic transformation decrease with increasing indium content. The decrease rate is faster than the rate published previously on polycrystalline samples, since no martensitic transformation was observed in our samples with the indium content x > 0.05. The results of X-ray diffraction measurements of low temperature martensitic phase show significant decrease of monoclinic lattice parameter a and increase of monoclinic lattice parameter c and γ angle with respect to increasing indium content. Composition dependence was observed also for the modulation vector in martensitic and pre-martensitic phase, where its x and y coordinates gain values around 3/7 and 1/3 respectively.

中文翻译：

---

Ni2MnGa1-xInx 单晶结构和调制的温度与成分相图和温度演变

摘要 采用 Bridgman 方法生长了一系列组成在 x = 0 到 0.15 之间变化的单晶 Ni2MnGa1-xInx 样品。从磁化强度和电阻率测量中获得临界温度。居里温度和前马氏体和马氏体转变温度随着铟含量的增加而降低。减少速率比先前在多晶样品上公布的速率更快，因为在我们的样品中未观察到铟含量 x > 0.05 的马氏体转变。低温马氏体相的X射线衍射测量结果表明，随着铟含量的增加，单斜晶格参数a显着降低，单斜晶格参数c和γ角增加。