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Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition
Journal of Electronic Testing ( IF 1.1 ) Pub Date : 2019-12-01 , DOI: 10.1007/s10836-019-05842-8
Thomas Moon , Hyun Woo Choi , David C. Keezer , Abhijit Chatterjee

This paper proposes a new high-speed self-calibrating digital transmitter with the ability to deliver high quality signals at low hardware cost. The proposed self-calibrating system performs on-line monitoring of the channel by performing measurements on the time-domain reflected (TDR) waveform. Unlike complex TDR instrumentation, the proposed system has the capability to reconstruct the reflected waveform using a single bit (monobit) sampler. Using very little hardware, a specific feature of the reflected waveform (area over time or integral) is extracted and used to drive a signal pre-emphasis scheme that maximizes the opening of the signal eye diagram without any communication with the receiver. The absence of such physical loopback significantly reduces the time and complexity of feedback based transmitter calibration techniques, especially where multiple transmission channels are concerned. Further, the proposed scheme is useful in the presence of single or multiple transmission line imperfections or defects. The proposed technique is implemented via a printed circuit board (PCB) prototype and measurement results demonstrate that it is capable of detecting defects in the digital I/O channel and adapting the channel to improve the received signal eye-diagram without direct feedback from the receiver.

中文翻译:

使用 Monobit 信号采集的高速串行 I/O 系统的高效内置测试和校准

本文提出了一种新型高速自校准数字发射机,能够以较低的硬件成本提供高质量的信号。建议的自校准系统通过对时域反射 (TDR) 波形执行测量来执行通道的在线监测。与复杂的 TDR 仪器不同,所提出的系统能够使用单比特(monobit)采样器重建反射波形。使用很少的硬件,反射波形的特定特征(随时间变化的面积或积分)被提取并用于驱动信号预加重方案,该方案可在不与接收器进行任何通信的情况下最大化信号眼图的开度。没有这种物理环回显着减少了基于反馈的发射机校准技术的时间和复杂性,特别是在涉及多个传输通道的情况下。此外,所提出的方案在存在单个或多个传输线缺陷或缺陷的情况下是有用的。所提出的技术是通过印刷电路板 (PCB) 原型实现的,测量结果表明它能够检测数字 I/O 通道中的缺陷并调整通道以改善接收信号的眼图,而无需来自接收器的直接反馈.
更新日期:2019-12-01
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