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Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs
Journal of Electronic Testing ( IF 1.1 ) Pub Date : 2020-04-01 , DOI: 10.1007/s10836-020-05872-7
Tanusree Kaibartta , G. P. Biswas , Debesh Kumar Das

In 3D IC, wrapper chains can span across vertical directions which causes the increase in number of TSVs(through-silicon-vias)(which is used to interconnect different cores in the vertical directions). Excessive use of TSVs in wrapper design causes routing congestion and additional overhead in manufacturing. Therefore, optimization of wrapper length and judicious use of TSVs are the focus of 3D wrapper architecture design. In this work, we first propose a heuristic procedure to determine the placement of wrapper elements in several layers of 3D SOC for a number of wrapper chains and interconnect them using available number of TSVs such that the length of the longest wrapper length (LWL) is minimized. Then we apply particle swarm optimization (PSO) based metaheuristic approach on the results obtained in first case to determine the placement of wrapper chains and interconnect them using minimum number of TSVs such that the length of LWL is minimized. We compare our results with earlier works and the experimental results show the efficacy of our algorithm.

中文翻译:

基于 TSV 的 3D SOC 的测试包装长度和 TSV 的协同优化

在 3D IC 中,封装链可以跨越垂直方向,这导致 TSV(硅通孔)(用于在垂直方向上互连不同的内核)数量增加。在包装设计中过度使用 TSV 会导致布线拥塞和制造中的额外开销。因此,包装长度的优化和 TSV 的明智使用是 3D 包装架构设计的重点。在这项工作中,我们首先提出了一种启发式程序,以确定包装器元素在 3D SOC 的几层中的位置,用于许多包装器链,并使用可用数量的 TSV 将它们互连,以便最长包装器长度 (LWL) 的长度为最小化。然后,我们将基于粒子群优化 (PSO) 的元启发式方法应用于第一种情况下获得的结果,以确定包装链的位置,并使用最少数量的 TSV 将它们互连,从而使 LWL 的长度最小化。我们将我们的结果与早期的工作进行了比较,实验结果表明了我们算法的有效性。
更新日期:2020-04-01
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