Deterministic test generation methods are time consuming and, this has led to emergence of simulation-based approaches. The basis of simulation-based methods is to propose a number of test vectors, evaluate the efficiency of the proposed vectors, and accept or reject them. In these methods, the efficiency of each test vector is traditionally evaluated based on fault coverage of that vector. In this paper an alternative criterion based on probabilistic simulation approaches is proposed that can be calculated much faster than fault coverage. Statistical evaluations confirm a strong correlation between the proposed measure and fault coverage. The proposed measure can be used in simulation-based and meta-heuristic test generation methods to achieve speedup. In order to indicate efficiency of the proposed probabilistic measure, two test generation methods that utilize this measure are suggested and exploited to generate test for ISCAS85 benchmark circuits. These test generation methods are called PMI_PRUNE and PMI_GA . Our results demonstrate that PMI_PRUNE can achieve up to 21.2x, while the maximum speedup in PMI_GA is 5.0x. The average speedup in PMI_PRUNE and PMI_GA is about 9.6x, and 2.7x respectively.

中文翻译：

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使用概率价值指标加速测试方法

确定性测试生成方法非常耗时，这导致了基于模拟的方法的出现。基于模拟的方法的基础是提出多个测试向量，评估所提出向量的效率，并接受或拒绝它们。在这些方法中，每个测试向量的效率传统上是基于该向量的故障覆盖率来评估的。在本文中，提出了一种基于概率模拟方法的替代标准，其计算速度比故障覆盖率快得多。统计评估证实了所提出的措施和故障覆盖率之间的强相关性。所提出的措施可用于基于模拟和元启发式测试生成方法以实现加速。为了表明所提议的概率度量的效率，建议并利用两种利用此措施的测试生成方法来生成 ISCAS85 基准电路的测试。这些测试生成方法称为 PMI_PRUNE 和 PMI_GA 。我们的结果表明 PMI_PRUNE 可以达到 21.2 倍，而 PMI_GA 中的最大加速为 5.0 倍。PMI_PRUNE 和 PMI_GA 的平均加速分别约为 9.6 倍和 2.7 倍。