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Bright High-Purity Quantum Emitters in Aluminum Nitride Integrated Photonics
ACS Photonics ( IF 6.5 ) Pub Date : 2020-09-21 , DOI: 10.1021/acsphotonics.0c01259
Tsung-Ju Lu 1 , Benjamin Lienhard 1 , Kwang-Yong Jeong 1 , Hyowon Moon 1 , Ava Iranmanesh 1 , Gabriele Grosso 2 , Dirk Englund 1
Affiliation  

Solid-state quantum emitters (QEs) are fundamental in photonic-based quantum information processing. There is strong interest to develop high-quality QEs in III-nitride semiconductors because of their sophisticated manufacturing driven by large and growing applications in optoelectronics, high voltage power transistors, and microwave amplifiers. Here, the generation and direct integration of QEs in an aluminum nitride-based photonic integrated circuit platform is reported. For individual waveguide-integrated QEs, an off-chip count rate exceeding 6 × 104 counts per second (cps; saturation rate >8.6 × 104 cps) is measured at room temperature under continuous-wave (CW) excitation. In an unpatterned thin-film sample, antibunching with g(2)(0) ∼ 0.08 and photon count rates exceeding 8 × 105 cps (saturation rate >1 × 106 cps) are measured at room temperature under CW excitation. Although spin and detailed optical line width measurements are left for future work, these results already show the potential for high-quality QEs monolithically integrated in a wide range of III-nitride device technologies that would enable new quantum device opportunities and industrial scalability.

中文翻译:

氮化铝集成光子学中的明亮高纯量子发射体

固态量子发射器(QE)是基于光子的量子信息处理的基础。由于在光电子,高压功率晶体管和微波放大器中的大型且不断增长的应用推动了它们的复杂制造,因此在III型氮化物半导体中开发高质量QE引起了人们极大的兴趣。在此,报道了基于氮化铝的光子集成电路平台中QE的产生和直接集成。对于单个集成了波导的QE,在室温下在连续波(CW)激励下测量的片外计数速率超过每秒6×10 4个计数(cps;饱和率> 8.6×10 4 cps)。在无图案的薄膜样品中,用g (2)反聚束(0)〜0.08且在室温下CW激发下测得的光子计数率超过8×10 5 cps(饱和率> 1×10 6 cps)。尽管自旋和详细的光学线宽测量留待未来工作,但这些结果已经表明,将高质量QE单片集成在各种III型氮化物器件技术中的潜力将为新的量子器件机会和工业可扩展性提供支持。
更新日期:2020-10-21
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