Numerous non-classicality criteria based on the probabilities of experimental photocount or theoretical photon-number distributions are derived using several approaches. Relations among the derived criteria are revealed and the fundamental criteria are identified. They are grouped into parametric systems that allow the analysis of the non-classicality from different points of view (‘local’ non-classicality, pairwise character of photon correlations, etc.). Considering their structure, the criteria may be divided into groups that differ in the power to resolve the non-classicality. Quantification of the non-classicality using the Lee non-classicality depth and the non-classicality counting parameter is discussed. The used number of field’s modes is identified as an important parameter that may cause unexpected results. An appropriate linear transformation of a photocount (photon-number) distribution into its s-ordered form, needed for the determination of the non-classicality depth, is derived. For comparison, the derived criteria are applied both to an experimental photocount histogram of a twin beam and the reconstructed photon-number distributions with different levels of the noise.

中文翻译：

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由二次检波器表征的二分光学场的非经典性和纠缠准则II：基于概率的准则

使用几种方法可以得出基于实验光计数或理论光子数分布概率的许多非经典标准。揭示了导出标准之间的关系，并确定了基本标准。它们分为参数系统，可以从不同的角度分析非经典性（“局部”非经典性，光子相关性的成对特征等）。考虑到它们的结构，可以将标准分为解决非经典性的能力不同的组。讨论了使用Lee非经典度深度和非经典计数参数对非经典度进行量化。字段模式的已使用数量被标识为可能导致意外结果的重要参数。推导了确定非经典深度所需的适当的光计数（光子数）分布线性转换为S阶形式。为了进行比较，将导出的标准应用于双光束的实验光计数直方图和具有不同噪声水平的重构光子数分布。