Full-field measurement techniques are invaluable tools for investigating material behavior across length-scales. In the current work, a full-field measurement technique, the Grid Method, is implemented within a scanning electron microscope to demonstrate its ability to capture deformation heterogeneities at sub-grain length-scales. Microgrids, fabricated using focused ion beam platinum deposition are positioned on multiple areas with different underlying microstructure of an aluminum 1100 oligo-crystal. In-situ scanning electron microscope tensile testing is then conducted while capturing micrographs of the deposited grids after individual loading increments. Strain maps are generated through localized spectral analysis of a reference (non-deformed) and deformed micrographs. The strain maps exhibit intragranular and transgranular heterogeneities. The current work demonstrates the successful implementation and promise of the SEM grid method for extracting strain maps at reduced length-scales.

中文翻译：

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使用扫描电子显微镜网格法在亚晶粒尺度上进行原位全场应变测量

全场测量技术是研究跨长度尺度的材料行为的宝贵工具。在目前的工作中，一种全场测量技术，即网格法，在扫描电子显微镜中实施，以证明其在亚晶粒长度尺度上捕捉变形不均匀性的能力。使用聚焦离子束铂沉积制造的微网格位于具有不同底层微观结构的铝 1100 寡晶的多个区域。然后进行原位扫描电子显微镜拉伸测试，同时在单个加载增量后捕获沉积网格的显微照片。应变图是通过参考（未变形）和变形显微照片的局部光谱分析生成的。应变图表现出颗粒内和跨颗粒的异质性。