Surface Propensity of Anions in a Binary Ionic Liquid Mixture Assessed by Full-Range Angle-Resolved-XPS and Surface Tension Measurements.,ChemPhysChem

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Surface Propensity of Anions in a Binary Ionic Liquid Mixture Assessed by Full-Range Angle-Resolved-XPS and Surface Tension Measurements.
ChemPhysChem ( IF 2.3 ) Pub Date : 2020-09-21 , DOI: 10.1002/cphc.202000750
Erdinc Oz ₁ , Ozgur Sahin ₁ , Halil I Okur ₁ , Sefik Suzer ₁

Affiliation

Angle‐resolved X‐ray photoelectron spectroscopy and contact‐angle measurements guided by a signal attenuation model are utilized to extract molar composition and anion enrichment in the vacuum interface of a binary ionic liquid mixture, having a common quaternary ammonium cation and two different anions. By using the intensity ratio of the F1s peaks belonging to the two different anions recorded at the full electron take‐off angle range, from 0° to 80°, we have determined that only a fractionally covered and anion enriched surface layer can predict the AR‐XPS data, which is also consistent with surface tension measurements. Moreover, the more bulky and non‐spherical anion enrichment is evident even at the conventional and the so assumed bulk sensitive take‐off angle of 0°. This methodology provides a surface enrichment factor of the molecular ions and clearly serves as an experimental evidence for recently debated surface layering and/or island structure in ionic liquid systems.

中文翻译：

通过全量程角分辨XPS和表面张力测量来评估二元离子液体混合物中阴离子的表面倾向性。

利用信号衰减模型指导的角分辨X射线光电子能谱和接触角测量，可提取二元离子液体混合物（具有共同的季铵阳离子和两种不同的阴离子）的真空界面中的摩尔组成和阴离子富集。通过使用在从0°到80°的整个电子起飞角范围记录的属于两个不同阴离子的F1s峰的强度比，我们确定只有部分覆盖且富含阴离子的表面层才能预测AR ‐XPS数据，也与表面张力测量结果一致。此外，即使在常规的和假定的0°体积敏感起飞角下，也可以看到更大体积和非球形的阴离子富集。

更新日期：2020-11-06

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