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A heuristic approach for near optimal truncated sequential test of exponential distribution
Sequential Analysis ( IF 0.6 ) Pub Date : 2018-10-02 , DOI: 10.1080/07474946.2018.1554887
Sigui Hu 1, 2 , Honglei Wang 1
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Abstract Optimal truncated sequential test of the exponential distribution is studied in this paper. Definitions and relative concepts of optimal truncated sequential test are discussed. A heuristic approach, sample space sorting method (SSSM) and the procedures are established to solve a near optimal truncated sequential test. Comparing with the test plans provided by international standard IEC 61124 (2012) and Russian national standard GOST R 27.402 (1995), the results show that the near optimal tests proposed in this paper can keep the error probabilities almost equivalence to the nominal error levels and save more synthetical expected test times and maximum expected test times simultaneously.

中文翻译:

指数分布近似最优截断序列检验的启发式方法

摘要 本文研究了指数分布的最优截断序列检验。讨论了最优截断顺序检验的定义和相关概念。建立了启发式方法、样本空间排序方法 (SSSM) 和程序来解决接近最优的截断顺序测试。与国际标准 IEC 61124 (2012) 和俄罗斯国家标准 GOST R 27.402 (1995) 提供的测试方案相比,结果表明,本文提出的近最优测试可以保持误差概率几乎等于标称误差水平,并且同时节省更多的综合预期测试时间和最大预期测试时间。
更新日期:2018-10-02
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