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Understanding the formation mechanism of subsurface damage in potassium dihydrogen phosphate crystals during ultra-precision fly cutting
Advances in Manufacturing ( IF 4.2 ) Pub Date : 2019-07-18 , DOI: 10.1007/s40436-019-00265-2
Yong Zhang , Ning Hou , Liang-Chi Zhang

Potassium dihydrogen phosphate (KDP) crystals play an important role in high-energy laser systems, but the laser damage threshold (LDT) of KDP components is lower than expected. The LDT is significantly influenced by subsurface damage produced in KDP crystals. However, it is very challenging to detect the subsurface damage caused by processing because a KDP is soft, brittle, and sensitive to the external environment (e.g., humidity, temperature and applied stress). Conventional characterization methods such as transmission electron microscopy are ineffective for this purpose. This paper proposes a nondestructive detection method called grazing incidence X-ray diffraction (GIXD) to investigate the formation of subsurface damage during ultra-precision fly cutting of KDP crystals. Some crystal planes, namely (200), (112), (312), (211), (220), (202), (301), (213), (310) and (303), were detected in the processed subsurface with the aid of GIXD, which provided very different results for KDP crystal bulk. These results mean that single KDP crystals change into a lattice misalignment structure (LMS) due to mechanical stress in the subsurface. These crystal planes match the slip systems of the KDP crystals, implying that dislocations nucleate and propagate along slip systems to result in the formation of the LMS under shear and compression stresses. The discovery of the LMS in the subsurface provides a new insight into the nature of the laser-induced damage of KDP crystals.

中文翻译:

了解超精密飞剪过程中磷酸二氢钾晶体表面损伤的形成机理

磷酸二氢钾(KDP)晶体在高能激光系统中起重要作用,但KDP组件的激光损伤阈值(LDT)低于预期。LDT受KDP晶体产生的地下破坏的影响很大。但是,由于KDP柔软,易碎并且对外部环境(例如,湿度,温度和施加的应力)敏感,因此检测由加工引起的地下破坏非常具有挑战性。常规的表征方法例如透射电子显微镜对于该目的是无效的。本文提出了一种无损检测方法,称为掠入射X射线衍射(GIXD),以研究KDP晶体超精密飞切割过程中地下损伤的形成。一些晶面,即(200),(112),(312),(211),(220),(202),借助GIXD在加工的次表面中检测到了(301),(213),(310)和(303),这为KDP晶体块提供了截然不同的结果。这些结果意味着,由于表面下的机械应力,单个KDP晶体变为晶格失配结构(LMS)。这些晶面与KDP晶体的滑移系统相匹配,这意味着位错成核并沿着滑移系统传播,从而导致在剪切应力和压缩应力下形成LMS。LMS在地下的发现为激光诱导的KDP晶体损坏的性质提供了新的见识。这些结果意味着,由于表面下的机械应力,单个KDP晶体变为晶格未对准结构(LMS)。这些晶面与KDP晶体的滑移系统相匹配,这意味着位错成核并沿着滑移系统传播,从而导致在剪切应力和压缩应力下形成LMS。LMS在地下的发现为激光诱导的KDP晶体损坏的性质提供了新的见识。这些结果意味着,由于表面下的机械应力,单个KDP晶体变为晶格失配结构(LMS)。这些晶面与KDP晶体的滑移系统相匹配,这意味着位错成核并沿着滑移系统传播,从而导致在剪切应力和压缩应力下形成LMS。LMS在地下的发现为激光诱导的KDP晶体损坏的性质提供了新的见识。
更新日期:2019-07-18
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