Abstract Product lifetime is one of the most important issues associated with circular and sharing economies. In the face of global warming, increasing product quality and product lifetime can enhance product value and industry competitiveness. Many electronic products use designs with spare electronic components to enhance their reliability. To prevent the loss of generality, we assumed that an electronic product has m electronic components, that is, one primary electronic component and m-1 spare electronic components. When the primary electronic component fails, then the product will immediately switch to a spare. Under the assumption that the warranty period is L units of time, we proposed a lifetime performance index for electronic products. With an identical mean time between failure (MTBF) for each electronic component, we investigated the relationships between the number of electronic components and the lifetime performance index, failure rate, and reliability of the product. We next developed uniformly minimum variance unbiased (UMVU) estimator for the lifetime performance index of electronic products and its probability density function. Then we established the uniformly most powerful (UMP) test and the power of the test for the lifetime performance index for electronic products. Finally, we presented a numerical example to demonstrate the applicability of the proposed method and model.

中文翻译：

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电子产品寿命性能指标

摘要 产品寿命是与循环和共享经济相关的最重要问题之一。面对全球变暖，提高产品质量和产品寿命可以提升产品价值和行业竞争力。许多电子产品使用带有备用电子元件的设计来提高其可靠性。为了不失一般性，我们假设一个电子产品有 m 个电子元件，即一个主电子元件和 m-1 个备用电子元件。当主要电子元件出现故障时，产品将立即切换到备用元件。在保修期为L个时间单位的假设下，我们提出了电子产品的终身性能指标。每个电子元件的平均故障间隔时间 (MTBF) 相同，我们调查了电子元件的数量与产品寿命性能指标、故障率和可靠性之间的关系。我们接下来为电子产品的寿命性能指数及其概率密度函数开发了一致最小方差无偏（UMVU）估计器。然后我们建立了统一最强大（UMP）测试和电子产品寿命性能指标测试的功效。最后，我们提出了一个数值例子来证明所提出的方法和模型的适用性。我们接下来为电子产品的寿命性能指数及其概率密度函数开发了一致最小方差无偏（UMVU）估计器。然后我们建立了统一最强大（UMP）测试和电子产品寿命性能指标测试的功效。最后，我们提出了一个数值例子来证明所提出的方法和模型的适用性。我们接下来为电子产品的寿命性能指数及其概率密度函数开发了一致最小方差无偏（UMVU）估计器。然后我们建立了统一最强大（UMP）测试和电子产品寿命性能指标测试的功效。最后，我们提出了一个数值例子来证明所提出的方法和模型的适用性。