New method of measurement of dielectric constant and loss tangent for small samples of lossy dielectrics, including plain semiconductors, using non-oversized resonators being parts of the recently developed cavity switches for sub-terahertz bands is proposed. Strong influence of the tangent loss value to the Q-factor of the resonator is calculated and observed in experiments. A simple monosemantic algorithm to retrieve explicit mathematical expressions for the complex permittivity from the experimental data is demonstrated. The advantage of the new method over the known ones is much lower (up to million times) volume of the sample needed to analyze.

中文翻译：

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使用腔开关的亚兆赫兹复介电常数测量方法

提出了一种新的测量介电常数和损耗角正切的新方法的方法，该方法包括使用未超大尺寸的谐振器作为亚太赫兹频段的最新腔开关的一部分，以测量包括普通半导体在内的小量损耗介质。在实验中计算并观察到切线损耗值对谐振器Q因子的强烈影响。演示了一种简单的单语义算法，可从实验数据中检索复介电常数的显式数学表达式。与已知方法相比，新方法的优势在于分析所需的样品量要低得多（最多百万倍）。