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Comprehensive Test Procedure for Digital Instruments and Devices of Automated Versatile Systems
IOP Conference Series: Materials Science and Engineering Pub Date : 2020-09-16 , DOI: 10.1088/1757-899x/915/1/012032 E M Khusnutdinova 1 , P P Pavlov 2 , V P Fandeyev 2 , R N Khizbullin 2 , A N Khusnutdinov 2 , I V Cherepen’kin 2
中文翻译:
自动化多功能系统的数字仪器和设备的综合测试程序
更新日期:2020-09-16
IOP Conference Series: Materials Science and Engineering Pub Date : 2020-09-16 , DOI: 10.1088/1757-899x/915/1/012032 E M Khusnutdinova 1 , P P Pavlov 2 , V P Fandeyev 2 , R N Khizbullin 2 , A N Khusnutdinov 2 , I V Cherepen’kin 2
Affiliation
The authors present a comprehensive test procedure for digital devices, based on the calculation and control of two or more characteristics of a binary signal at a control point. The procedure is aimed at how to increase the reliability of performance monitoring and localization of the failure of digital devices as part of automated versatile systems.
中文翻译:
自动化多功能系统的数字仪器和设备的综合测试程序
作者基于在控制点计算和控制二进制信号的两个或多个特性,提出了一种用于数字设备的综合测试程序。该程序旨在如何提高性能监控的可靠性和数字设备故障定位的可靠性,作为自动化多功能系统的一部分。