We report on the electric field response of 180nanodomain walls in BaTiO${}_3$ using in situ electrical biasing in transmission electron microscopy (TEM). The sample is biased on a micro-device designed for reliable testing whose key attributes are confirmed by finite element calculations. The presence of weakly charged zig-zag domain walls at room temperature is attributed to the geometric confinement of the device. The motion of the domain walls under the applied electric field allows to extract local P-E loops where distinct domain wall pinning in deep and random energy potential profiles, characteristic for “hard” and “soft” ferroelectrics, respectively, are observed. “Hard” domain wall pinning results in asymmetrical loops typical for “hard” ferroelectrics while the “soft” domain wall pinning follows Rayleigh-like behaviour. All effects are measured locally and directly from the imaged domain structure. ${}^{*}$vasiliki.tileli@epfl.ch …

中文翻译：

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原位透射电镜探测BaTiO3中180∘畴壁的局部软硬钉扎

我们报告了BaTiO中180纳米畴壁的电场响应${}_3$在透射电子显微镜（TEM）中使用原位电偏压。样品被偏置在为可靠测试而设计的微型设备上，其关键属性已通过有限元计算得到确认。在室温下，带电之字形畴壁弱的存在是由于器件的几何限制。畴壁在外加电场作用下的运动允许提取局部PE回路，在该回路中，深层和随机能势曲线分别出现了不同的畴壁钉扎，分别观察到“硬”和“软”铁电体的特征。“硬”畴壁钉扎导致典型的“硬”铁电体不对称回路，而“软”畴壁钉扎遵循瑞利式行为。所有效果都是从成像域结构本地直接测量的。${}^{*}$vasiliki.tileli@epfl.ch…