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Tungsten passivation layer (WO3) formation mechanisms during chemical mechanical planarization in the presence of oxidizers
Applied Surface Science ( IF 6.7 ) Pub Date : 2021-01-01 , DOI: 10.1016/j.apsusc.2020.147862
Maneesh Kumar Poddar , Palwasha Jalalzai , Samrina Sahir , Nagendra Prasad Yerriboina , Tae-Gon Kim , Jin-Goo Park

Abstract Effects of single and mixed oxidants of Fe(NO3)3 and H2O2 containing acidic silica slurries were studied to investigate the mechanism of tungsten (W) chemical mechanical planarization (CMP). The W polishing rate obtained from the CMP test depicted high W polishing rate in the presence of mixed oxidants of Fe(NO3)3 and H2O2 as compared to a single oxidant of either H2O2 or Fe(NO3)3. The formation of a passive layer of tungsten oxide (WO3) and W dissolution could be the reason for these results as confirmed by XPS. Further investigation revealed that the generation of much stronger oxidants of hydroxyl radicals ( OH) was solely responsible for WO3 layer formation. Quantitative evaluation of OH generation was estimated using a UV–visible spectrophotometer and confirmed that in-situ generation of hydroxyl radicals ( OH) could be a main driving force for the high W polishing rate by converting a hard W film into a soft passive film of WO3. WO3 film formation was further confirmed using potentiodynamic polarization studies, which showed a smaller value of corrosion current density (Icorr) in mixed oxidants of Fe(NO3)3 and H2O2 as compared to the large values of Icorr observed for H2O2 alone. This study revealed that a single oxidizer of either Fe(NO3)3 or H2O2 was not capable of achieving a high W removal rate. Rather, only mixed oxidants of Fe(NO3)3 and H2O2 could cause a high W polishing rate due to excessive in-situ generation of OH radicals during the W CMP process.

中文翻译:

存在氧化剂的化学机械平坦化过程中钨钝化层 (WO3) 的形成机制

摘要 研究了含Fe(NO3)3 和H2O2 酸性二氧化硅浆料的单一和混合氧化剂的影响,以研究钨(W) 化学机械平坦化(CMP) 的机理。从 CMP 测试获得的 W 抛光速率表明,与 H2O2 或 Fe(NO3)3 的单一氧化剂相比,在 Fe(NO3)3 和 H2O2 的混合氧化剂存在下,W 抛光速率较高。XPS 证实,氧化钨 (WO3) 钝化层的形成和 W 溶解可能是这些结果的原因。进一步的研究表明,产生更强的羟基自由基 (OH) 氧化剂是 WO3 层形成的唯一原因。使用紫外-可见分光光度计对 OH 生成进行了定量评估,并确认通过将硬 W 膜转化为软钝化膜,羟基自由基 (OH) 的原位生成可能是高 W 抛光速率的主要驱动力。 WO3。使用动电位极化研究进一步证实了 WO3 膜的形成,与单独观察到的大 Icorr 值相比,Fe(NO3)3 和 H2O2 的混合氧化剂中的腐蚀电流密度 (Icorr) 值较小。该研究表明,Fe(NO3)3 或 H2O2 的单一氧化剂无法实现高 W 去除率。相反,只有 Fe(NO3)3 和 H2O2 的混合氧化剂才能导致高 W 抛光速率,因为在 W CMP 过程中原位生成了过多的 OH 自由基。
更新日期:2021-01-01
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