Abstract Photoluminescence (PL) and radioluminescence (RL) measurements were made on both nanoparticle and bulk NaMgF3:Ce,Sm, before, during, and after X-ray irradiation. The relative concentrations of Sm3+ and Sm2+ were markedly different for the nanoparticle and bulk samples. Sm3+ dominated the PL in NaMgF3:Ce,Sm nanoparticles while the bulk sample showed Sm3+ and Sm2+ PL. Ce3+ PL and Ce3+ sensitisation of the Sm3+ PL emission was observed for nanoparticle and bulk samples. In both samples we observed the radiation-induced valence conversions Sm3+ → Sm2+ and Ce3+ → Ce4+, such that the PL intensities of each valence could be used to monitor radiation doses. A more intense PL from oxygen-related point defects was found in nanoparticles that decreased with radiation dose and hence may also be used for radiation dosimetry. Sm3+, Sm2+, and Ce3+ RL was seen in the bulk sample where the RL depended on the dose and the Ce3+ RL was independent of the dose above ~4 kGy. Only Sm3+ and Sm2+ RL was found in nanoparticles where the Sm3+ RL decreased by only 0.5%/kGy above 3 kGy. Our results show that nanoparticle and bulk NaMgF3:Ce,Sm can potentially be used as PL and RL dosimeters, where the signals from Ce3+, Sm2+, Sm3+, and the oxygen-related defect provide multiple means of measuring real-time and cumulative doses that may be useful for radiotherapy quality assurance.

中文翻译：

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电离辐射对纳米颗粒和块状 NaMgF3:Ce,Sm 光致发光和辐射发光性质的影响

摘要 在 X 射线照射之前、期间和之后，对纳米颗粒和块状 NaMgF3:Ce,Sm 进行了光致发光 (PL) 和辐射发光 (RL) 测量。Sm3+ 和 Sm2+ 的相对浓度对于纳米颗粒和大块样品明显不同。Sm3+ 在 NaMgF3:Ce,Sm 纳米粒子中占主导地位，而大块样品显示 Sm3+ 和 Sm2+ PL。对于纳米颗粒和大块样品，观察到 Ce3+ PL 和 Ce3+ 对 Sm3+ PL 发射的敏化。在这两个样品中，我们观察到辐射诱导的价态转换 Sm3+ → Sm2+ 和 Ce3+ → Ce4+，因此每个价态的 PL 强度可用于监测辐射剂量。在纳米粒子中发现了来自氧相关点缺陷的更强烈的 PL，其随辐射剂量降低，因此也可用于辐射剂量测定。Sm3+, Sm2+, 和 Ce3+ RL 在散装样品中可见，其中 RL 取决于剂量，而 Ce3+ RL 与高于 ~4 kGy 的剂量无关。在纳米粒子中仅发现 Sm3+ 和 Sm2+ RL，其中 Sm3+ RL 在 3 kGy 以上仅降低 0.5%/kGy。我们的结果表明，纳米颗粒和块状 NaMgF3:Ce,Sm 有可能用作 PL 和 RL 剂量计，其中来自 Ce3+、Sm2+、Sm3+ 和氧相关缺陷的信号提供了多种测量实时和累积剂量的方法，可能有助于放射治疗质量保证。