[1] Lytle FW. The EXAFS family tree: a personal history of the development of x-ray absorption fine structure. J Synchrotron Rad. 1999;6:123–134. [2] Binsted N, Pack MJ, Teller MT, Evans J. Combined EXAFS and powder diffraction analysis. J Am Chem Soc. 1996;118:11200–11210. [3] Chantler CT, Bunker BA, Abe H, Kimura M, Newville M, Welter E. A call for a round robin study of XAFS stability and platform dependence at synchrotron beamlines on well defined samples. J Synchrotron Rad. 2018;25(4):935–943. [4] Filipponi A, Di Cicco A. Atomic background in x-ray absorption spectra of fifth-period elements: evidence for double-electron excitation edges. Phys Rev A. 1995;52:1072–1078. [5] Jolliffe IT. Principal component analysis. New York: Springer-Verlag; 2002. [6] Parsons AD, Price SWT, Wadeson N, Basham M, Beale AM, Ashton AW, Mosselmans JFW, Quinn PD. Automatic processing of multimodal tomography datasets. J Synchrotron Radiat. 2017;24:248–256. [7] Rehr JJ, Albers RC. Theoretical approaches to x-ray absorption fine structure. Rev Mod Phys. 2000;72:621–654.

中文翻译：

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X 射线纳米化学概念和发展

[1] 莱特尔 FW。EXAFS 家谱：X 射线吸收精细结构发展的个人历史。J 同步辐射。1999；6：123-134。[2] Binsted N、Pack MJ、Teller MT、Evans J。EXAFS 和粉末衍射分析相结合。J Am Chem Soc。1996 年；118：11200-11210。[3] Chantler CT、Bunker BA、Abe H、Kimura M、Newville M、Welter E。呼吁对定义明确的样本上同步加速器光束线的 XAFS 稳定性和平台依赖性进行循环研究。J 同步辐射。2018;25(4):935–943。[4] Filipponi A, Di Cicco A. 五周期元素 X 射线吸收光谱中的原子背景：双电子激发边缘的证据。Phys Rev A. 1995；52：1072-1078。[5] 乔利夫 IT。主成分分析。纽约：Springer-Verlag；2002. [6] Parsons AD，Price SWT，Wadeson N，Basham M，Beale AM，Ashton AW，Mosselmans JFW，Quinn PD。多模态断层扫描数据集的自动处理。J 同步辐射。2017；24：248-256。[7] Rehr JJ，Albers RC。X射线吸收精细结构的理论方法。Rev Mod Phys。2000；72：621-654。